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Design for manufacturing and yield
This video features a lecture by Fabian Klass for the Stanford University Computer Systems Colloquium (EE 380). The focus of this talk is on IC manufacturing process variability - i.e., how to design circuits for yield in the presence of manufacturing variations; also, the use of statistical methods in circuit design is presented.
EE 380 | Computer Systems Colloquium:
http://www.stanford.edu/class/ee380/
Stanford Computer Systems Laboratory:
http://csl.stanford.edu/
Stanford Center for Professional Development:
http://scpd.stanford.edu/
Stanford University Channel on YouTube:
http://www.youtube.com/stanforduniver...
EE 380 | Computer Systems Colloquium:
http://www.stanford.edu/class/ee380/
Stanford Computer Systems Laboratory:
http://csl.stanford.edu/
Stanford Center for Professional Development:
http://scpd.stanford.edu/
Stanford University Channel on YouTube:
http://www.youtube.com/stanforduniver...
Access this 77-minute video by clicking on the link below.
