This video features a lecture by Fabian Klass for the Stanford University Computer Systems Colloquium (EE 380). The focus of this talk is on IC manufacturing process variability - i.e., how to design circuits for yield in the presence of manufacturing variations; also, the use of statistical methods in circuit design is presented.

EE 380 | Computer Systems Colloquium:

Stanford Computer Systems Laboratory:

Stanford Center for Professional Development:

Stanford University Channel on YouTube:
Access this 77-minute video by clicking on the link below.